
Innodisk has announced the release of innovative DDR5 CUDIMM RAM modules.
DDR5 CUDIMMs are improved standard UDIMM modules. The new modules combine high data transfer rates with a unique architecture aimed at eliminating problems associated with signal degradation at high frequencies.
Main advantages of DDR5 CUDIMM:
- Backward compatibility:
The CUDIMM architecture keeps the existing industry-standard DIMM form factor, allowing these modules to be easily integrated into existing systems, providing a smooth transition to the next generation of memory. - Integrated Clock Generator (CKD):
One of the key features of the new modules is the presence of an integrated clock generator, known as the Clock Driver (CKD). This component solves the problem of signal degradation during data transfer at high speeds, which is often observed in traditional memory modules.

The CKD chip consists of 35 contacts. Half of the contacts are used for power and grounding, and the other half are used for signal processing and transmission.

CKD operation algorithm:
- Receiving an incoming signal from the memory controller.
- Analysis and processing of the signal to assess its quality and stability.
- Generation of a new signal, cleared of noise and distortion.
- Distribution of the regenerated signal to the memory chips of the CUDIMM module.
This algorithm is executed in real time, which ensures stable operation of the memory at high frequencies without loss of stability.
Technical characteristics of the new DDR5 CUDIMM by Innodisk:
- Data transfer rate: up to 6400 MT/s.
- Capacity: 8GB to 64GB.
- Architecture: CUDIMM.
- ECC support: does not support error correction.
- Gold Finger: 288 pins.
- Bus: x64.
- Latency: CAS: 22, 26, 28, 30, 32, 36, 40, 42, 46, 48, 50, 52, 54, 56 cycles.
- Voltage: JEDEC 1.1V.
- Operating temperature: 0°C–95°C.
- Anti-sulfur layer: Yes.
Capacity (GB) |
P/n |
8 |
|
16 |
|
24 |
|
32 |
|
48 |
|
64 |
Innodisk's new DDR5 CUDIMM series will be a good solution for those looking for a combination of high performance and reliability in mission-critical systems.